Analytical & Characterisation Systems
JEOL Scanning Electron Microscope
JEOL SEM systems for high-magnification surface imaging and microstructural characterisation.
Overview
A scanning electron microscope resolves surface detail far beyond the reach of optical microscopy, which is what failure analysis, particle characterisation and materials development depend on. Symtek represents JEOL SEM systems in India and supports the full lifecycle, from site preparation through installation, training and service.
Key features
- High-magnification imaging of surface structure and morphology
- Suited to failure analysis, particle sizing and materials development
- Elemental microanalysis available through detector options
- Site preparation guidance before delivery
- Installation, operator training and ongoing service from Symtek
Applications
- Failure analysis and fractography in engineering laboratories
- Particle size, shape and distribution characterisation
- Materials research and development
- Surface, coating and thin film examination
- Quality investigation of manufactured components
Specification & options
Options & variants
Configuration depends on sample type, required resolution and any microanalysis needed. We will review your samples and applications before proposing a system.
Availability
Quoted on enquiry. Send your requirement and we
will confirm specification, availability and price.
Need exact specifications? Detailed specifications depend on the configuration and the instrument this item will be used with. Tell us what you are running and we will confirm the correct variant before quoting.
